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HomeLibraryPower, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement
Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement
ISBN-13: 9780367023430
Hardcover
226 Pages

Power, Thermal, Noise, and Signal Integrity Issues on Substrate/Interconnects Entanglement

by Ma, Yue, Gontrand, Christian

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Product Details

ISBN-139780367023430
ISBN-100367023431
PublisherCRC Press
Published03-2019
Edition1st
LanguageEnglish
FormatHardcover
Pages226

About This Book

As demand for on-chip functionalities and requirements for low power operation continue to increase as a result of the emergence in mobile, wearable and internet-of-things (IoT) products, 3D/2.5D have been identified as an inevitable path moving forward. As circuits become more and more complex, especially three-dimensional ones, new insights have to be developed in many domains, including electrical, thermal, noise, interconnects, and parasites. It is the entanglement of such domains that begins the very key challenge as we enter in 3D nano-electronics. This book aims to develop this new paradigm, going to a synthesis beginning between many technical aspects.